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S E M I N A R: Addressing Integrated Circuit Integrity Using Statistical Analysis and Machine Learning Techniques

Name: S E M I N A R: Addressing Integrated Circuit Integrity Using Statistical Analysis and Machine Learning Techniques
Start: 2020-01-16T10:40:00+00:00
End: 2020-01-16T11:30:00+00:00
Location: EA 409

16 Ocak 2020 @ 13:40 - 14:30

Etkinlik Navigasyon

« S E M I N A R: Memory-Centric, Low Complexity Image Reconstruction for the Exascale Era of Computing
MS THESIS PRESENTATION Distributed Stream-Processing Framework for Graph-based Sequence Alignment »

Dr. Burçin Çakır
Postdoctoral Fellow
Electrical Engineering and Computer Science Department
Harvard University

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Detaylar

Tarih:: 16 Ocak 2020
Saat:: 13:40 - 14:30
Website:: http://www.cs.bilkent.edu.tr/~sekreter/seminars/2020-01-16-13.htm

Mekan

EA 409

Etkinlik Navigasyon

« S E M I N A R: Memory-Centric, Low Complexity Image Reconstruction for the Exascale Era of Computing
MS THESIS PRESENTATION Distributed Stream-Processing Framework for Graph-based Sequence Alignment »